25th EPFL CMi Annual Review Meeting

The 25th EPFL CMi Annual Review Meeting is an established annual gathering organized by the Center of MicroNanotechnology (CMi) at EPFL. The event brings together professors, researchers, students, and industry partners to present and discuss recent research achievements in the field of micro- and nanofabrication. The program includes invited talks, poster sessions, parallel presentations, and an industry exhibition, providing an excellent platform for knowledge exchange and networking across academia and industry.

   Time: May 12th, 2026 (9:00 – 16:00)
   Place: SwissTech Convention Center, Lausanne, Switzerland

We are pleased to participate in this year's meeting and will be contributing in several ways:

Exhibition Booth Visit us at our booth to explore our latest software solutions for e-beam lithography, process correction, metrology, and workflow optimization.

Presentation We will be giving a talk titled: "Optimizing Fabrication of Photonics and Plasmonic Devices: Software Solutions for Lithography and Metrology" as part of the Parallel Talks session.

Hands-on Workshop Join our interactive workshop: "Advanced SEM Metrology Applications Using InSPEC" The workshop begins on May 12 and continues on May 13 with more in-depth discussions and demonstrations.

GenISys Regional Manager Dmitri Titko, Corporate SEM Metrology and Inspection Application Engineer Anirudh Peyyety will be on-site and look forward to connecting, sharing ideas, and demonstrating practical applications of our technology.

REGISTRATION

The registration is free of charge.
Please register here: MicroNanoFabrication Annual Review Meeting - 25th Edition

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